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MLZ (eng)
Lichtenbergstr.1
85748 Garching
NDP
Neutron Depth Profiling
This instrument is focussed on cold neutrons. All parameters given here are valid during the current operation of FRM II. Please get in touch with the instrument team well in advance for all further details (length of experiment etc.).
Neutron Depth Profiling (NDP) is a nuclear analytical method based on the determination of the energy loss of charged particles in matter. This loss is dependent on the thicknesses and the densities of the layers between the place of emission and the detector. The new setup at the PGAA facility enables a non-destructive quantitative analysis based on the maximum energies of the spectral shapes, and also a reconstruction of the depth profiles based on the energy losses. The method is very sensitive to certain light elements/ nuclides (3He, 6Li, 10B or 14N) with detection limits down to the ppba range. The depth resolution can be as good as 5 nm, but it is highly matrix dependent. One of the most important application of NDP is battery research (lithium-ion-batteries). An NDP measurement is also possible in operando during the charge cycles of batteries.
NDP in a nutshellInstrument scientists
Dr. Zsolt Revay
Phone: +49 (0)89 289-12694
E-Mail: zsolt.revay@frm2.tum.de
Dr. Christian Stieghorst
Phone: +49 (0)89 289-54871
E-Mail: christian.stieghorst@frm2.tum.de
Operated by
Funding
Publications
M. Trunk, M. Wetjen, L. Werner, R. Gernhäuser, B. Märkisch, Zs. Revay, H. Gasteiger, R. Gilles, Materials Science Applications of Neutron Depth Profiling at the PGAA facility of Heinz Maier-Leibnitz Zentrum. (2018). Materials Characterization, 146, 127-134, http://dx.doi.org/10.1016/j.matchar.2018.09.030
M. Wetjen, M. Trunk, L. Werner, R. Gernhäuser, B. Märkisch, Zs. Revay, R. Gilles, H. Gasteiger, Quantifying the Distribution of Electrolyte Decomposition Products in Silicon-Graphite Electrodes by Neutron Depth Profiling. (2018). Journal of The Electrochemical Society, 165, 10, A2340-A2348 , http://dx.doi.org/10.1149/2.1341810jes
M. Wetjen, M. Trunk, L. Werner, R. Gernhäuser, B. Märkisch, Zs. Revay, R. Gilles, H. Gasteiger, Monitoring the Lithium Concentration across the Thickness of Silicon-Graphite Electrodes during the first (De-)Lithiation. (2019). Journal of The Electrochemical Society, 166, 8, A1408-A1411. http://dx.doi.org/10.1149/2.0581908jes
Citation of the instrument
L. Werner, M. Trunk, R. Gernhäuser, R. Gilles, B. Märkisch, Zs. Revay, The new Neutron Depth Profiling Instrument N4DP at the Heinz Maier-Leibnitz Zentrum. (2018). Nucl Instr Meth A 911, 30-36, http://dx.doi.org/10.1016/j.nima.2018.09.113
MLZ is a cooperation between:
> Technische Universität München> Helmholtz-Zentrum Hereon > Forschungszentrum JülichMLZ is a member of:
MLZ on social media: