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Pulsed low energy positron system
PLEPS is a unique tool for depth profiling of defects with positron annihilation lifetime spectroscopy using a pulsed positron beam of variable energy.
Positron lifetime measurements allow to determine type and size of open volume defects (such as vacancies, vacancy-clusters, dislocations, grain boundaries etc., and free volumes in polymers) in a wide variety of materials and provide information on defect-concentration. In combination with a monoenergetic positron beam of variable energy depth-resolved defect analysis becomes possible.