Physics Laboratory

The Physics Laboratory of TUM provides scientists with techniques for analysis and preparation of samples for subsequent neutron scattering experiments. An x-ray diffractometer for phase determination of powder and solid samples, in-situ battery measurements and for thin film systems is available. Furthermore, a differential scanning calorimeter and a bi-potentiostat are available. A wide range of machines for polishing, cutting, etching or annealing are available for sample preparation purposes.

Please get in touch with the Physics Laboratory two to three weeks in advance the measurement so that the equipment can be prepared for you. You can check the current bookings in the Calendar.

Note: Access to the Physics Laboratory can only be granted after a safety traning has been performed. Please email to Physics Laboratory for any questions.

Equipment

Analytic:

PPMS-Dynacool 14 Tesla

available options

DC resistance
AC resistance (ETO)
vibrating sample magnetometer (VSM)
AC susceptibility (ACMS II)
heat capacity
horizontal rotator for transport measurements
pressure cells for magnetometry (1.3 GPa) and transport measurements (2.7 GPa)
dilution refrigerator (50 mK – 4 K) for AC susceptibility, heat capacity, electrical transport (ETO/resistivity)
synchronous source and measure system M81 SSM from LakeShore (DC/AC transport)

PANalytical Empyrean X-ray Diffractometer

phase identification and quantification
structure analysis
on solids, powders, thin films and capillaries
reflection and transmission measurements

technical specifications

x-ray tubes: Cu (λ = 1.541 Å), Mo (λ = 0.711 Å)
angular range 2θ = -9° … 120°, d2θ = 0.005°
detectors: GaliPIX3D (2d), X’Celerator (1d), Scintillator (0d)
optics: monochromator (Cu), parallel mirror (Cu), focussing mirror (Mo)
sample stages: reflection – transmission spinner, eulerian cradle
temperatur stage: T = +25°C … +1200°C (vacuum/inert gas) for solid samples in reflection (Anton Paar HTK 1200N)
temperatur stage: T = -20°C … +600°C (vacuum/inert gas) for solids, coin cells or capillaries in reflection or transmission (Anton Paar TTK 600)

Bruker D8 X-Ray Residual Stress Diffractometer

coming soon

technical specifications

x-ray tube: Cr (λ = 2.290 Å)
angular range 2θ
1/4-circle eulerian cradle (χ = -3° … 90°, ψ = 0 … 360°)
XYZ-table (X = ± 75 mm, Y = ± 75 mm, Z = 0 … 13 mm)
detector: Dectris Mythen 1K (1d)

Bruker D8 X-Ray Reflectometer/Diffractometer

thickness, density, roughness (thin films), phase identification
thin films, powder samples
reflection and transmission measurements in θ-2θ-Geometry

technical specifications

x-ray tube: Cu (λ = 1.541 Å)
angular range 2θ = -10° … 160°, d2θ = 0.003°
optics: parallel beam mirror (Göbelmirror)
stages: vacuum table (reflection), powder spinner (reflection/transmission)
detector: scintillator (0d)

Hecus S3 MicroPix – Small Angle X-Ray Scattering

(outsourced to Prof. Müller-Buschbaum, TUM Physik E13)

technical specifications

SAXS: Pilatus 2D detector 84 × 34 mm²
WAXS: 1D wide angle detector, 2θ = 18° … 30°
in-situ annealing of solid-, liquid- or powder samples, T = -20°C … +300°C

Differential Scanning Calorimetry

Perkin Elmer DSC 8500: T = -180°C … +550°C, dT = ± 0.05°C
Setaram Evotherm µDSC Evo3: T = -20°C … +120°C, dT = ± 0.001°C

BioLogic – Bi-Potentiostat

technical specifications

cyclic voltammetry: I = 1 nA … 400 mA, dI = ± 760 pA, 5 µV, 20 µs
impedance spectroscopy: 10 µHz – 1 MHz
current boosters: 4 A and 100 A

Leica DM 6000 – Digital Microscope

technical specifications

fully automated upright microscope system
illumination and imaging methods: bright- & darkfield, polarization-, phase-, differential-interference-contrast (DIC), multifocus, in reflection and transmission
Leica LAS software