SPM (in commissioning)

Scanning positron microscope

The Munich scanning positron microscope permits positron lifetime measurements with a lateral resolution in the μm range and within an energy range of 1 – 20 keV. Thus, this instrument enables the measurement of high-resolved 3D defect maps.

At present, the SPM is commissioned for future user operation.

Technical data

Beam properties

Positron implantation energy: < 20 keV
Beam spot: < 1 μm
Count rate: > 2000 cps
Time window: 20 ns
Time resolution: < 250 ps
Peak / background: > 5000 : 1 / > 2000 : 1

Typical measurement times

SPM: ≈ 1 day for one 2D-Scan (12 × 12 μm²)

Literature

Egger, W., J. Phys. Conf. Ser. 240(1), 012164 (2010).
Mitteneder, J. et al., J. Phys.: Conf. Series 791, 012006 (2017).
Dickmann, M. et al., NIM-A 821, 40 (2016).
Mitteneder, J., AIP Conf. Proc. 2182, 040002 (2019).
Egger, W. et. al., Appl. Surf. Sci. 194, 214 (2002).

Instrument scientists

Dr. Marcel Dickmann
Phone UniBw: +49 (0)89 6004-3508
Phone MLZ:+49 (0)89 289-11770
E-mail: marcel.dickmann@unibw.de

Johannes Mitteneder
Phone UniBw: +49 (0)89 6004-3524
Phone MLZ: +49 (0)89 289-54722
E-mail: Johannes.Mitteneder@unibw.de

Operated by

Funding

News

Successful ErUM-Pro proposals

Citation of the instrument

Heinz Maier-Leibnitz Zentrum. (2015). SPM: Scanning positron microscope. Journal of large-scale research facilities, 1, A26. http://dx.doi.org/10.17815/jlsrf-1-53

For citation please always include the DOI.

Gallery

SPM

SPM - Time spectrum

Time spectrum of the threefold bunched and triply moderated positron beam
Insert: intensity distribution of the beam focused by a long focal electric lens

SPM - scheme

The optical column of the SPM (light gray) connected to the SPM interface. Both is borne by a special frame construction (light yellow), which ensures the vibration decoupling via heavy damper (dark gray, only one shown).