SPM (in commissioning)

Scanning positron microscope

The Munich scanning positron microscope permits positron lifetime measurements with a lateral resolution in the μm range and within an energy range of 1 – 20 keV. Thus, this instrument enables the measurement of high-resolved 3D defect maps.

At present, the SPM is commissioned for future user operation.

Technical data

Beam properties

Positron implantation energy: < 20 keV
Beam spot: < 1 μm
Count rate: > 2000 cps
Time window: 20 ns
Time resolution: < 250 ps
Peak / background: > 5000 : 1 / > 2000 : 1

Typical measurement times

SPM: ≈ 1 day for one 2D-Scan (12 × 12 μm²)

Literature

Egger, W., J. Phys. Conf. Ser. 240(1), 012164 (2010).
Mitteneder, J. et al., J. Phys.: Conf. Series 791, 012006 (2017).
Dickmann, M. et al., NIM-A 821, 40 (2016).
Mitteneder, J., AIP Conf. Proc. 2182, 040002 (2019).
Egger, W. et. al., Appl. Surf. Sci. 194, 214 (2002).

Instrument scientists

Dr. Marcel Dickmann
Phone UniBw: +49 (0)89 6004-3508
Phone MLZ:+49 (0)89 289-11770
E-mail: marcel.dickmann@unibw.de

Johannes Mitteneder
Phone UniBw: +49 (0)89 6004-3524
Phone MLZ: +49 (0)89 289-54722
E-mail: Johannes.Mitteneder@unibw.de

Operated by

Funding

News

Successful ErUM-Pro proposals

Citation templates for users

In all publications based on experiments on this instrument, you must provide some acknowledgements. To make your work easier, we have prepared all the necessary templates for you on this page.

Gallery

SPM

SPM - Time spectrum

Time spectrum of the threefold bunched and triply moderated positron beam
Insert: intensity distribution of the beam focused by a long focal electric lens

SPM - scheme

The optical column of the SPM (light gray) connected to the SPM interface. Both is borne by a special frame construction (light yellow), which ensures the vibration decoupling via heavy damper (dark gray, only one shown).