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85748 Garching

CDBS

Coincidence Doppler-broadening spectrometer

The Coincidence Doppler-broadening spectrometer (CDBS) at NEPOMUC allows the detection of open-volume defects and their chemical surrounding. Defect distributions can be imaged in 3D by lateral scanning with the energy variable positron beam.

The Doppler broadening of the 511 keV annihilation line contains information on the electron momentum distribution at the positron annihilation site in the sample. Since the probability of core electron annihilation decreases in open-volume defects, a narrowing of the annihilation line is observed. For this reason, DBS is particularly suited to detect lattice defects in a sample.

Combined with the monoenergetic positron beam, DBS allows the analysis of defect profiles, energy-dependent 2D imaging of defects, and defect annealing as a function of temperature. In addition, CDBS is applied to gain elemental information about the positron annihilation site and, thus, the chemical surrounding of defects.

The CDBS can also use an integrated 22Na positron source, enabling measurements independent of the availability of the NEPOMUC beam. Using the 22Na source only makes bulk measurements possible.

Typical applications

DBS can be used to determine relative open-volume defect concentrations. In semiconductors, for example, open-volume defects typically reduce conductivity. In polymer membranes, on the other hand, large open-volume defects, also called voids, are vital to enable the transport of molecules across the membrane. This is commonly used in desalination facilities.

Using CDBS, hardening processes in light metal alloys can be investigated. Atomic vacancies are essential when age-hardening alloys form precipitates around them. The precipitation of atom clusters leads to significantly improved material properties such as strength.

Technical data
Beam properties
  • Positron implantation energy: E = 0.2 – 30 keV
  • Mean positron implantation depth: up to several µm (material dependent)
  • Beam size: adjustable between 0.03 – 3 mm Ø
2D x-y-scans
  • Scan area: 20 × 20 mm2
  • Step size adjustable between 0.1 and 10 mm
High-purity Ge detectors
  • 30 – 35% efficiency
  • Energy resolution: 1.4 at 477.6 keV
Sample
  • Size
    • optimal size: 6 × 6 mm2, thickness: 0.1 – 1 mm
    • in general: 0.5 × 0.5 × 0.01 mm3 – 20 × 20 × 3 mm3
  • Optimum four samples on one sample holder: < 10 × 10 mm2
  • Temperature: 100 – 900 K
Typical measurement times
  • DBS: ~ 1 – 2 min/ spectrum
  • DBS: ~ 8 h full 2D overview scan (with Δx = Δy = 1 mm)
  • DBS: ~ 1 h depth profile (t = 2 min, 30 energy values)
  • CDBS: ~ 4 – 6 h/ spectrum

Instrument scientist

Prof. Dr. Christoph Hugenschmidt
Phone: +49 (0)89 289-14609
E-mail: christoph.hugenschmidt@frm2.tum.de

CDBS
Phone: +49 (0)89 289-14774

TUM Research Group

Operated and funded by

TUM

News

Successful ErUM-Pro proposals

Successful ErUM-Pro proposals

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Research with positrons

Research with positrons

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Citation of the instrument

Heinz Maier-Leibnitz Zentrum. (2015). CDBS: Coincident Doppler-broadening spectrometer. Journal of large-scale research facilities, 1, A23. http://dx.doi.org/10.17815/jlsrf-1-50

For citation please always include the DOI.

Gallery

CDBS
CDBS
© W. Schürmann, TUM
2D defect map
2D defect map

2D defect map of an plastically deformed Al sample (below) and optical image (above).

Elemental signature of layered samples
Elemental signature of layered samples

Thin Sn layers of various thickness buried in an Al matrix: Ratio curves recorded with CDBS reveal the elemental signature of layered samples.

MLZ is a cooperation between:

Technische Universität München> Technische Universität MünchenHelmholtz-Zentrum Hereon> Helmholtz-Zentrum Hereon
Forschungszentrum Jülich> Forschungszentrum Jülich

MLZ is a member of:

LENS> LENSERF-AISBL> ERF-AISBL

MLZ on social media: