Cryo-Transmission Electron Microscopy

Transmission electron microscopy is a complementary technique with neutron scattering in the frame of soft matter studies. With the TEM, real space investigations are performed to access information about shape, size and size distribution of particles, self-assembly and aggregation. Users will be supported by JCNS scientists to conduct the suitable preparation and TEM investigation.

• JEOL 200 kV JEM-FS2200 with a field emission gun (FEG).
• Magnification from 50x to 1 000 000x, resolution of 0,27 nm in point and 0,1 nm in lattice.
• CMOS camera with 2048 × 2048 pixels.
• Grid preparation by carbon sputtering on bare grids.
• Glow discharge process to make the coated grids hydrophilic.
• Plunge freezer to prepare cryo-specimen for direct imaging (Cryo-DI), for freeze fracture and direct imaging (FFDI) or freeze fracture before shadowing, Pt/C or Ta/W, so-called freeze fracture and electron microscopy (FFEM).
• Cryo-specimen investigation at low temperature around -180°C under vacuum.
• Ultramicrotome for room temperature and cryo sectioning.

The objective of the JCNS Transmission Electron Microscopy (TEM) laboratory is to offer the preparation and investigation of specimen to users who wish to complement their neutron experiments at the MLZ by using TEM either on-site or remotely.

TEM beamline application must be submitted jointly with the related neutron scattering beamtime proposal via our online User Office system GhOST.

Prior to proposal submission it is mandatory for the user to contact the TEM laboratory scientist in order to discuss the feasibility of the research idea and the required time for the TEM investigations.

The terms of the use of the TEM facility are described in the following concept document:

TEM user concept